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  篇名 作者 主题词 文摘
  二次检索范围  16 篇文章
     
     
 
Linearly polarized light from substrate emitting ring cavity quantum cascade lasers

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81101-811013
       
 
Terahertz quantum well photodetectors with improved designs by exploiting many-body effects

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81105-811054
       
 
Auger recombination in InGaN/GaN quantum wells: A full-Brillouin-zone study

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81106-811065
       
 
The effect of a varied NH3 flux on growth of AlN interlayers for InAlN/GaN heterostructures

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81602-816024
       
 
Determination of surface recombination velocities of organic monolayers on silicon through Kelvin pr...

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81603-816035
       
 
Graphene as tunable transparent electrode material on GaN: Layer-number-dependent optical and electr...

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81604-816044
       
 
Effective-mass theory of metal-semiconductor contact resistivity

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81605-816054
       
 
Competitive Si and La effect in HfO2 phase stabilization in multi-layer (La2O3)0.08(HfO2) films

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81607-816074
       
 
Spectroscopy of self-assembled one-dimensional atomic string: The role of step edge

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81608-816084
       
 
Evaluation of the surface bonding energy of an InP membrane bonded oxide-free to Si using instrument...

Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 103 Issue: 8 Page: 81901-819014