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二次检索范围  104 篇文章

篇名 文摘 全文 主题词 作者 刊名 ISSN

Reduced free carrier absorption loss in midinfrared double heterostructure diode lasers grown by liquid phase epitaxy Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Tip-enhanced Raman spectroscopy for investigating adsorbed species on a single-crystal surface using electrochemically prepared Au tips Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Detection of THz radiation with semiconductor diode lasers Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Temperature and angle tuning of second harmonic generation in media with a short-range order Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Simulation for generation of 15  fs laser pulses by Raman backscatter in plasmas Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           First-principles study of pressure-induced metal-insulator transition in BiNiO3 Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Polymer constraint effect for electrothermal bimorph microactuators Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Direct hcp" src="http://scitation.aip.org/stockgif3/rarr.gif" align=bottom border=0>bcc structural phase transition observed in titanium alloy at high pressure Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           In situ Raman characterization of reversible phase transition in stress-induced amorphous silicon Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0           Investigation of the structural transformation behavior of Ge2Sb2Te5 thin films using high resolution electron microscopy Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 91 Issue: 10 Page: 0-0

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