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篇名 作者 主题词 文摘

二次检索范围  145 篇文章

篇名 文摘 全文 主题词 作者 刊名 ISSN

Thin film patterning by surface-plasmon-induced thermocapillarity Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Experimental quantum key distribution with active phase randomization Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Ultrathin amorphous Si layer formation by femtosecond laser pulse irradiation Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Direct observation of controlled strain-induced second harmonic generation in a Co0.25Pd0.75 thin film on a Pb(ZrTi)O3 substrate Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Optimization of electrical conductivity of LaCrO3 through doping: A combined study of molecular modeling and experiment Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Comment on “Influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts” [Appl. Phys. Lett. 89, 033503 (2006)] Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Response to “Comment on Influence of indium tin oxide thin-film quality on reverse leakage current of indium tin oxide/n-GaN Schottky contacts [Appl. Phys. Lett. 90, 046101 (2007)]” Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Erratum: “High temperature integrated ultrasonic shear wave probes” [Appl. Phys. Lett. 89, 183506 (2006)] Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Erratum: “Theoretical study of the electronic transport property of the hydrogen-Pt contact system” [Appl. Phys. Lett. 89, 182119 (2006)] Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0           Insights on the physical mechanism behind negative bias temperature instabilities Publisher: American Institute of Physics Journal: Applied Physics Letters Volume: 90 Issue: 4 Page: 0-0

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